ALPHA-PARTICLE SPECTROMETRY WITH SEMICONDUCTOR DETECTORS

被引：0

作者：

HOFKER, WK

NIENHUIS, K

POST, JC

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来源：

PHILIPS TECHNICAL REVIEW | 1969年 / 30卷 / 01期

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暂无

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T [工业技术];

学科分类号：

08 ;

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页码：13 / +

页数：1

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