ALPHA-PARTICLE SPECTROMETRY WITH SEMICONDUCTOR DETECTORS

被引：0
作者：
HOFKER, WK
NIENHUIS, K
POST, JC
机构：
来源：
PHILIPS TECHNICAL REVIEW | 1969年 / 30卷 / 01期
关键词：
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：13 / +
页数：1
相关论文
共 50 条
[21]   An Advanced Analysis Program for Alpha-Particle Spectrometry [J].
Radioact Radiochem, 1 (18)
[22]   CONSTRAINTS ON ESCAPING ALPHA-PARTICLE DETECTORS FOR IGNITED TOKAMAKS [J].
ZWEBEN, SJ ;
BOIVIN, R ;
LIEW, SL ;
OWENS, DK ;
STRACHAN, JD ;
ULRICKSON, M .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1990, 61 (11) :3505-3508
[23]   The effects of intense gamma-irradiation on the alpha-particle response of silicon carbide semiconductor radiation detectors [J].
Ruddy, Frank H. ;
Seidel, John G. .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2007, 263 (01) :163-168
[24]   Range-based method of alpha-particle spectrometry using LiF fluorescent nuclear track detectors [J].
Bilski, P. ;
Marczewska, B. ;
Sankowska, M. ;
Gieszczyk, W. ;
Mietelski, J. W. .
MEASUREMENT, 2020, 160 (160)
[25]   STUDIES OF DIFFUSION IN SOLIDS USING ALPHA-PARTICLE SPECTROMETRY [J].
MARTINEZ, AM ;
MULAS, P .
TRANSACTIONS OF THE AMERICAN NUCLEAR SOCIETY, 1972, 15 (02) :713-+
[26]   CVD diamond alpha-particle detectors with different electrode geometry [J].
Wang, LJ ;
Lou, YY ;
Su, QF ;
Shi, WM ;
Xia, YB .
OPTICS EXPRESS, 2005, 13 (21) :8612-8617
[27]   Alpha-particle counting and spectrometry in a primary standardisation laboratory [J].
Pomme, Stefaan ;
Sibbens, Geodele .
ACTA CHIMICA SLOVENICA, 2008, 55 (01) :111-119
[28]   ALPHA-PARTICLE POLARIZATION EFFECTS IN CADMIUM TELLURIDE RADIATION DETECTORS [J].
BILBE, RM ;
NICHOLLS, JE ;
LUNN, B ;
TOTTERDELL, DHJ .
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1982, 71 (01) :239-243
[29]   RAPID AND PRECISE ALPHA-PARTICLE SPECTROMETRY FOR PLUTONIUM MATERIALS [J].
MATLACK, GM ;
BUBERNAK, J .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1984, 223 (2-3) :528-530
[30]   Monte Carlo simulation as an aid to alpha-particle spectrometry [J].
Sánchez, AM ;
Timón, AF ;
Bland, CJ .
ADVANCED MONTE CARLO FOR RADIATION PHYSICS, PARTICLE TRANSPORT SIMULATION AND APPLICATIONS, 2001, :1145-1150
12345