STROBOSCOPIC SCANNING ELECTRON MICROSCOPY

被引:95
作者
PLOWS, GS
NIXON, WC
机构
来源
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS | 1968年 / 1卷 / 06期
关键词
D O I
10.1088/0022-3735/1/6/302
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:595 / &
相关论文
共 12 条
[1]   DIRECT OBSERVATION OF DOMAIN STRUCTURE AND MAGNETIC FIELDS IN SCANNING ELECTRON MICROSCOPE [J].
BANBURY, JR ;
NIXON, WC .
JOURNAL OF SCIENTIFIC INSTRUMENTS, 1967, 44 (11) :889-&
[2]  
DORSEY JR, 1966, 1 NAT C EL PROB MICR
[3]  
DUBININA EM, T B, V23, P756
[4]  
DUBININA EM, 1959, IZV AN SSSR F, V23
[5]  
DUKOV VG, 1964, 3 P EUR REG C EL MIC, VA283
[6]  
LUKYANOV AE, 1966, 6 INT C EL MICR KYOT, V1, P611
[7]  
Oatley C.W., 1957, J ELECTRON CONTR, V2, P568
[8]  
OATLEY CW, 1965, ADV ELECTRON ELECTRO, V21, P222
[9]  
OATLEY CW, 1965, ADV ELECTRON ELECTRO, V21, P207
[10]  
SPIVAK CB, 1966, B ACAD SCI USSR P, V30, P809