ELECTRON MICROSCOPE IMAGE PROFILES OF PLANAR DEFECTS IN CRYSTALS

被引：21
作者：
BOOKER, GR
HAZZLEDINE, PM
机构：
来源：
PHILOSOPHICAL MAGAZINE | 1967年 / 15卷 / 135期
关键词：
D O I：
10.1080/14786436708220899
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
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页码：523 / +
页数：1
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