HOLOGRAPHIC INTERFEROMETRIC METHOD OF MEASURING PLOTTER DISTORTION

被引：0
|
作者：
WYANT, JC [1 ]
ONEILL, PK [1 ]
MACGOVER.AJ [1 ]
机构：
[1] ITEK CORP,LEXINGTON,MA 02173
来源：
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA | 1973年 / 63卷 / 04期
关键词：
D O I：
暂无
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
引用
收藏
页码：498 / 498
页数：1
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