SCANNING ELECTRON-MICROSCOPE CHARACTERIZATION OF GAP RED-EMITTING DIODES

被引：71
作者：
HACKETT, WH
SAUL, RH
KAMMLOTT, GW
DIXON, RW
机构：
来源：
JOURNAL OF APPLIED PHYSICS | 1972年 / 43卷 / 06期
关键词：
D O I：
10.1063/1.1661606
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
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页码：2857 / +
页数：1
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