SCANNING ELECTRON-MICROSCOPE CHARACTERIZATION OF GAP RED-EMITTING DIODES

被引：71

作者：

HACKETT, WH

SAUL, RH

KAMMLOTT, GW

DIXON, RW

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1972年 / 43卷 / 06期

关键词：

D O I：

10.1063/1.1661606

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

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页码：2857 / +

页数：1

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