MEASUREMENT OF ULTRAFAST OPTICAL NONLINEARITIES USING A MODIFIED SAGNAC INTERFEROMETER

被引：43
作者：
GABRIEL, MC
WHITAKER, NA
DIRK, CW
KUZYK, MG
THAKUR, M
机构：
[1] UNIV TEXAS,DEPT CHEM,EL PASO,TX 79968
[2] WASHINGTON STATE UNIV,DEPT PHYS,PULLMAN,WA 99164
[3] AUBURN UNIV,DEPT MAT SCI,AUBURN,AL 36849
来源：
OPTICS LETTERS | 1991年 / 16卷 / 17期
关键词：
D O I：
10.1364/OL.16.001334
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
A method for the measurement of fast, intensity-dependent refractive-index changes with the use of a modified Sagnac ring interferometer is presented. The measurement is not degraded by slowly responding background index changes. Nonlinear refractive-index changes in an undoped silicon wafer, and in poly-bis toluene sulfonate polydiacetylene and dye-doped polymethyl methacrylate waveguides, were measured with the use of a cw mode-locked Nd:YAG laser.
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收藏
页码：1334 / 1336
页数：3
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