HARDNESS AND FRACTURE-TOUGHNESS OF SEMICONDUCTING MATERIALS STUDIED BY INDENTATION AND EROSION TECHNIQUES

被引：95
作者：
ERICSON, F
JOHANSSON, S
SCHWEITZ, JA
机构：
来源：
MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING | 1988年 / 105卷
关键词：
D O I：
10.1016/0025-5416(88)90489-2
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
引用
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页码：131 / 141
页数：11
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