ON CONTRIBUTION OF THE ELECTROSTATIC INTERACTION OF CHARGES TO THE MECHANISM OF THE SEMICONDUCTOR SURFACE RECONSTRUCTION

被引：0
|
作者：
ILCHENKO, LG
机构：
来源：
UKRAINSKII FIZICHESKII ZHURNAL | 1987年 / 32卷 / 06期
关键词：
D O I：
暂无
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
引用
收藏
页码：890 / 893
页数：4
相关论文
共 50 条
  • [21] On the Electrostatic Interaction between Point Charges due to Dielectrical Shielding
    Nguyen L.T.
    Do T.K.
    Nguyen D.V.
    Phan T.V.
    Progress in Electromagnetics Research Letters, 2022, 107 : 111 - 118
  • [22] On the Electrostatic Interaction between Point Charges due to Dielectrical Shielding
    Nguyen, Long T.
    Do, Tuan K.
    Nguyen, Duy, V
    Phan, Trung, V
    PROGRESS IN ELECTROMAGNETICS RESEARCH LETTERS, 2022, 107 : 111 - 118
  • [23] ELECTROSTATIC INTERACTION ENERGY OF IONIC LATTICES WITH STATISTICAL DISTRIBUTION OF CHARGES
    HAEFNER, K
    JAGODZIN.H
    ACTA CRYSTALLOGRAPHICA, 1966, 20 : 17 - &
  • [24] PRINCIPLES OF SEMICONDUCTOR SURFACE RECONSTRUCTION
    DUKE, CB
    SCANNING MICROSCOPY, 1994, 8 (04) : 753 - 764
  • [25] Theory of semiconductor surface reconstruction
    Srivastava, GP
    REPORTS ON PROGRESS IN PHYSICS, 1997, 60 (05) : 561 - 613
  • [26] Light patterning semiconductor nanoparticles by modulating surface charges
    He, Xiaoli
    Gu, Hongri
    Ma, Yanmei
    Cai, Yuhang
    Jiang, Huaide
    Zhang, Yi
    Xie, Hanhan
    Yang, Ming
    Fan, Xinjian
    Guo, Liang
    Yang, Zhan
    Hu, Chengzhi
    NATURE COMMUNICATIONS, 2024, 15 (01)
  • [27] THEORY FOR MEASUREMENT OF SURFACE CHARGES, USING ELECTROSTATIC INDUCTION METHOD
    MATVEEVA, IA
    PRONIN, VP
    SHEKHTMAN, LA
    ZHURNAL TEKHNICHESKOI FIZIKI, 1977, 47 (07): : 1389 - 1395
  • [28] Effect of induced surface charges on droplets breakup in electrostatic filed
    Wang, Zhentao
    Dong, Qingming
    Wang, Junfeng
    Gu, Liping
    Gaodianya Jishu/High Voltage Engineering, 2015, 41 (01): : 300 - 305
  • [29] Analysis of charges and surface states at the interfaces of semiconductor-insulator-semiconductor structures
    Berman, LS
    Belyakova, EI
    Kostina, LS
    Kim, ED
    Kim, SC
    SEMICONDUCTORS, 2000, 34 (07) : 786 - 789
  • [30] Analysis of charges and surface states at the interfaces of semiconductor-insulator-semiconductor structures
    L. S. Berman
    E. I. Belyakova
    L. S. Kostina
    E. D. Kim
    S. C. Kim
    Semiconductors, 2000, 34 : 786 - 789
12345