SCANNING AND ENVIRONMENTAL ELECTRON-MICROSCOPY STUDIES OF SILICONE RELEASE COATINGS

被引：4

作者：

STEIN, J ^{[1
]}

BOLON, RB ^{[1
]}

PORTA, ML ^{[1
]}

ROBERTSON, CD ^{[1
]}

GRENOBLE, ME ^{[1
]}

机构：

[1] GE SILICONES, WATERFORD, NY 12188 USA

来源：

INTERNATIONAL JOURNAL OF ADHESION AND ADHESIVES | 1992年 / 12卷 / 02期

关键词：

ADHESION; SILICONE RELEASE COATINGS; ENVIRONMENTAL SCANNING ELECTRON MICROSCOPY; UV-CURABLE SILICONES;

D O I：

10.1016/0143-7496(92)90032-Q

中图分类号：

TQ [化学工业];

学科分类号：

0817 ;

摘要：

Scanning electron microscopy (SEM) and environmental scanning electron microscopy (ESEM) were used to characterize silicone release coatings on a variety of paper substrates exhibiting different release values. A sectioning procedure was developed to measure coating thickness and penetration data. A 180-degrees peel substage was constructed for the EsEm and used to observe and record the microdeformation occurring at the parting interface. The results of this study show that the applied coating flows to fill in depressions on rough substrates, leaving thin, easily damaged layers on the high areas after cure. Such defect sites change the mechanism of peel.

引用

页码：111 / 116

页数：6

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