STRUCTURE OF THE NA/SI(100)2X1 AND CS/SI(100)2X1 INTERFACES INVESTIGATED BY PHOTOEMISSION EXTENDED X-RAY-ABSORPTION FINE-STRUCTURE

被引:27
作者
KIM, ST
SOUKIASSIAN, P
BARBIER, L
KAPOOR, S
HURYCH, Z
机构
[1] UNIV PARIS 11,DEPT PHYS,F-91405 ORSAY,FRANCE
[2] CENS,CEA,SERV RECH SURFACES & IRRADIAT MAT,F-91191 GIF SUR YVETTE,FRANCE
[3] NO ILLINOIS UNIV,DEPT PHYS,DE KALB,IL 60115
来源
PHYSICAL REVIEW B | 1991年 / 44卷 / 11期
关键词
D O I
10.1103/PhysRevB.44.5622
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We present a structural investigation of both clean and alkali-metal- (Na,Cs) covered Si(100)2 X 1 surfaces using photoemission extended x-ray-absorption fine structure. We find that the Na-Si bond length is the same for both low (0.4 monolayer) and 1-monolayer coverages at 2.80 +/- 0.1 angstrom, close to the sum of covalent radii, supporting the model of covalent bonding between Na and Si, even below 0.5 monolayer. Furthermore, in contrast to III-V semiconductors, Na and Cs do not significantly modify the structure of the Si(100)2 X 1 surface. We also comment on the dramatic changes in the Si-Si nearest neighbors during the initial stages of oxygen chemisorption on a sodium-covered silicon surface.
引用
收藏
页码:5622 / 5628
页数:7
相关论文
共 46 条
[1]   PHOTOELECTRON DIFFRACTION AND LOW-ENERGY ELECTRON-DIFFRACTION STUDIES OF CS, K/SI(001) SURFACES [J].
ABUKAWA, T ;
KONO, S .
SURFACE SCIENCE, 1989, 214 (1-2) :141-148
[2]   PHOTOELECTRON DIFFRACTION STUDY OF SI(001)2X1-K SURFACE - EXISTENCE OF A POTASSIUM DOUBLE-LAYER [J].
ABUKAWA, T ;
KONO, S .
PHYSICAL REVIEW B, 1988, 37 (15) :9097-9099
[3]   MEASUREMENT OF OVERLAYER-PLASMON DISPERSION IN K-CHAINS ADSORBED ON SI(001)2X1 [J].
ARUGA, T ;
TOCHIHARA, H ;
MURATA, Y .
PHYSICAL REVIEW LETTERS, 1984, 53 (04) :372-375
[4]  
CHOUDHARY K, UNPUB
[5]   PHOTOEMISSION EXTENDED X-RAY-ABSORPTION FINE-STRUCTURE FROM CLEAN AND AL-COVERED INP(110) SURFACES [J].
CHOUDHARY, KM ;
MANGAT, PS ;
MILLER, AE ;
KILDAY, D ;
FILIPPONI, A ;
MARGARITONDO, G .
PHYSICAL REVIEW B, 1988, 38 (02) :1566-1568
[6]   LOW-COVERAGE ALKALI-METAL-INDUCED SURFACE STRUCTURAL-CHANGES IN III-V-SEMICONDUCTORS - PHOTOEMISSION EXTENDED X-RAY-ABSORPTION FINE-STRUCTURE STUDY OF THE NA/INP(110) INTERFACE [J].
CHOUDHARY, KM ;
MANGAT, PS ;
STARNBERG, HI ;
HURYCH, Z ;
KILDAY, D ;
SOUKIASSIAN, P .
PHYSICAL REVIEW B, 1989, 39 (01) :759-762
[7]   PHOTOEMISSION EXAFS MEASUREMENTS OF AL-0 BOND LENGTHS IN AL FILMS [J].
CHOUDHARY, KM ;
KIM, ST ;
LEE, JH ;
SHAH, SN ;
DENBOER, ML ;
WILLIAMS, GP ;
ROTHBERG, GM .
JOURNAL DE PHYSIQUE, 1986, 47 (C-8) :203-207
[8]   ANGLE-RESOLVED PHOTOELECTRON-SPECTROSCOPY STUDY OF THE SI(001)2X1-K SURFACE [J].
ENTA, Y ;
KINOSHITA, T ;
SUZUKI, S ;
KONO, S .
PHYSICAL REVIEW B, 1987, 36 (18) :9801-9804
[9]   NA ADSORPTION ON SI(100) - DOSING RESULTS [J].
GLANDER, GS ;
WEBB, MB .
SURFACE SCIENCE, 1989, 222 (01) :64-83
[10]   ADSORPTION OF LI (K) ON THE SI(001)-(2X1) SURFACE - SCANNING-TUNNELING-MICROSCOPY STUDY [J].
HASEGAWA, Y ;
KAMIYA, I ;
HASHIZUME, T ;
SAKURAI, T ;
TOCHIHARA, H ;
KUBOTA, M ;
MURATA, Y .
PHYSICAL REVIEW B, 1990, 41 (14) :9688-9691