TECHNIQUE FOR DETECTION OF IONS IN HIGH-VOLTAGE ELECTRON-MICROSCOPES

被引：1

作者：

MCKINLEY, GV

机构：

[1] Metallurgy Div., AERE, Harwell, United Kingdom

来源：

RADIATION EFFECTS AND DEFECTS IN SOLIDS | 1978年 / 36卷 / 1-2期

关键词：

Compendex;

D O I：

10.1080/00337577808233167

中图分类号：

TL [原子能技术]; O571 [原子核物理学];

学科分类号：

0827 ; 082701 ;

摘要：

IONS

引用

页码：29 / 33

页数：5

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