TECHNIQUE FOR DETECTION OF IONS IN HIGH-VOLTAGE ELECTRON-MICROSCOPES

被引：1
作者：
MCKINLEY, GV
机构：
[1] Metallurgy Div., AERE, Harwell, United Kingdom
来源：
RADIATION EFFECTS AND DEFECTS IN SOLIDS | 1978年 / 36卷 / 1-2期
关键词：
Compendex;
D O I：
10.1080/00337577808233167
中图分类号：
TL [原子能技术]; O571 [原子核物理学];
学科分类号：
0827 ; 082701 ;
摘要：
IONS
引用
收藏
页码：29 / 33
页数：5
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