MODELING OF THE HP-1430A FEEDTHROUGH WIDEBAND (28-PS) SAMPLING HEAD

[1] CHAFFIN RJ, 1973, MICROWAVE SEMICONDUC, pCH6

[2] PRESENT CAPABILITIES OF NBS AUTOMATIC PULSE MEASUREMENT SYSTEM [J]. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1976, 25 (04) : 384 - 388

[3] SAMPLING FOR OSCILLOSCOPES AND OTHER RF SYSTEMS - DC THROUGH X-BAND [J]. IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1966, MT14 (12) : 629 - &

[4] COAXIAL-LINE PULSE-RESPONSE ERROR DUE TO A PLANAR SKIN-EFFECT APPROXIMATION [J]. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1972, IM21 (04) : 515 - &

[5] HOWARD D, 1966, WESCON1 TECH PAP 6

[6] KAPSOHILIN JN, 1966, ELECTRON DES MAR, P178

[7] NAHMAN NS, 1973, NBS73330 INT REP

[8] RAMO S, 1965, FIELDS WAVES COMMUNI, P462

[9] RIAD SM, 1978, NBS IR78881, pCH6

[10] RIAD SM, 1976, THESIS U TOLEDO TOLE, pCH6

[1] CHAFFIN RJ, 1973, MICROWAVE SEMICONDUC, pCH6

[2] PRESENT CAPABILITIES OF NBS AUTOMATIC PULSE MEASUREMENT SYSTEM [J]. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1976, 25 (04) : 384 - 388

[3] SAMPLING FOR OSCILLOSCOPES AND OTHER RF SYSTEMS - DC THROUGH X-BAND [J]. IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1966, MT14 (12) : 629 - &

[4] COAXIAL-LINE PULSE-RESPONSE ERROR DUE TO A PLANAR SKIN-EFFECT APPROXIMATION [J]. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1972, IM21 (04) : 515 - &

[5] HOWARD D, 1966, WESCON1 TECH PAP 6

[6] KAPSOHILIN JN, 1966, ELECTRON DES MAR, P178

[7] NAHMAN NS, 1973, NBS73330 INT REP

[8] RAMO S, 1965, FIELDS WAVES COMMUNI, P462

[9] RIAD SM, 1978, NBS IR78881, pCH6

[10] RIAD SM, 1976, THESIS U TOLEDO TOLE, pCH6