BACKSCATTERING SPECTROMETRY OF METAL LAYERS ON DIAMOND

被引：1

作者：

BURGEMEISTER, EA ^{[1
]}

SARIS, FW ^{[1
]}

机构：

[1] FOM,INST ATOOM & MOLEC FYS,AMSTERDAM,NETHERLANDS

来源：

APPLIED SURFACE SCIENCE | 1980年 / 6卷 / 3-4期

关键词：

D O I：

10.1016/0378-5963(80)90031-8

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：489 / 496

页数：8

共 7 条

[1] THERMAL-RESISTANCE AT METAL-DIAMOND INTERFACES IN RELATION TO MOUNTING OF MICROWAVE DIODES [J].

BURGEMEISTER, EA .

JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1977, 10 (14) :1923-1930

[2]

Chu W.K., 1978, BACKSCATTERING SPECT, V1st ed., DOI 10.1016/B978-0-12-173850-1.50008-9

[3] THIN-FILM INTERDIFFUSION .2. TI-RH, TI-PT, TI-RH-AU, AND TI-AU-RH [J].

DEBONTE, WJ ;

POATE, JM ;

MELLIARSMITH, CM ;

LEVESQUE, RA .

JOURNAL OF APPLIED PHYSICS, 1975, 46 (10) :4284-4290

[4]

Field J.E., 1979, PROPERTIES DIAMOND

[5] STUDIES ON AL2O3-TI-MO-AU METALLIZATION SYSTEM [J].

HARRIS, JM ;

LUGUJJO, E ;

CAMPISANO, SU ;

NICOLET, MA ;

SHIMA, R .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1975, 12 (01) :524-527

[6] DIFFUSION IN THIN-FILM TI-AU, TI-PD, AND TI-PT COUPLES [J].

TISONE, TC ;

DROBEK, J .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1972, 9 (01) :271-+

[7] DISPLACEMENT OF IMPURITIES IN SI BY IRRADIATION WITH ENERGETIC H+-PARTICLE OR HE+-PARTICLE [J].

WIGGERS, LW ;

SARIS, FW .

RADIATION EFFECTS AND DEFECTS IN SOLIDS, 1979, 41 (03) :149-164

← 1 →