X-ray diffraction measurements on metallic and semiconducting hexagonal NiS

被引：91

作者：

Trahan, Jeffrey ^{[1
]}

Goodrich, R. G.

Watkins, S. F.

机构：

[1] Louisiana State Univ, Dept Phys & Astron, Baton Rouge, LA 70803 USA

[2] Louisiana State Univ, Coates Chem Lab, Baton Rouge, LA 70803 USA

来源：

PHYSICAL REVIEW B-SOLID STATE | 1970年 / 2卷 / 08期

关键词：

D O I：

10.1103/PhysRevB.2.2859

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

The crystallographic structure of hexagonal Nis has been determined at temperatures above and below the metal-semiconducting transition. The powder x-ray diffraction peak intensities were used to determine the atom positions in both phases. The symmetry of the unit cell is found to change from P6(3)/mmc(D-6h(4)) in the metallic phase to P6(3)mc(C-6v(4)) in the semiconducting phase.

引用

页码：2859 / 2863

页数：5

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