XPS AND XRD STUDIES OF SUPPORTED PD-CU BIMETALLICS

被引：26
作者：
GUSTAFSON, BL
WEHNER, PS
机构：
[1] Eastman Chemical Company Research Laboratories, Kingsport
来源：
APPLIED SURFACE SCIENCE | 1991年 / 52卷 / 04期
关键词：
D O I：
10.1016/0169-4332(91)90068-U
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
XPS and XRD have been used to characterize carbon- and alumina-supported Pd-Cu bimetallic samples. Addition of Cu to supported Pd results in peak shifts in both XPS and XRD which are thought to be due to Pd-Cu bimetallic formation. The shift in the XPS Cu2p3/2 peak has been used to estimate the relative composition of the Pd-Cu bimetallic particles. The estimated composition of the bimetallic particles was found to be directly related to the nominal Pd and Cu metal loading levels.
引用
收藏
页码：261 / 270
页数：10
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