APPARATUS FOR WIDEBAND MONITORING OF OPTICAL COATINGS AND ITS USES

被引:5
作者
HU, XQ
CHEN, YM
TANG, JF
机构
来源
APPLIED OPTICS | 1989年 / 28卷 / 14期
关键词
D O I
10.1364/AO.28.002886
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
引用
收藏
页码:2886 / 2888
页数:3
相关论文
共 8 条
[1]   AUTOMATIC-DETERMINATION OF THE OPTICAL-CONSTANTS OF INHOMOGENEOUS THIN-FILMS [J].
BORGOGNO, JP ;
LAZARIDES, B ;
PELLETIER, E .
APPLIED OPTICS, 1982, 21 (22) :4020-4029
[2]   OPTICAL THIN-FILM MONITORING - RECENT ADVANCES AND LIMITATIONS [J].
BOUSQUET, P ;
PELLETIER, E .
THIN SOLID FILMS, 1981, 77 (1-3) :165-179
[3]   OPTICAL-CONSTANTS DERIVATION FOR AN INHOMOGENEOUS THIN-FILM FROM INSITU TRANSMISSION MEASUREMENTS [J].
BOVARD, B ;
VANMILLIGEN, FJ ;
MESSERLY, MJ ;
SAXE, SG ;
MACLEOD, HA .
APPLIED OPTICS, 1985, 24 (12) :1803-1807
[4]   ERROR COMPENSATION MECHANISMS IN SOME THIN-FILM MONITORING SYSTEMS [J].
MACLEOD, HA ;
PELLETIER, E .
OPTICA ACTA, 1977, 24 (09) :907-930
[5]  
PELLETIER E, 1983, P SOC PHOTO-OPT INST, V401, P74, DOI 10.1117/12.935505
[6]   DEVELOPMENT OF AN AUTOMATED SCANNING MONOCHROMATOR FOR MONITORING THIN-FILMS [J].
VANMILLIGEN, FJ ;
BOVARD, B ;
JACOBSON, MR ;
MUELLER, J ;
POTOFF, R ;
SHOEMAKER, RL ;
MACLEOD, HA .
APPLIED OPTICS, 1985, 24 (12) :1799-1802
[7]   WIDEBAND OPTICAL MONITORING OF NON-QUARTERWAVE MULTILAYER FILTERS [J].
VIDAL, B ;
FORNIER, A ;
PELLETIER, E .
APPLIED OPTICS, 1979, 18 (22) :3851-3856
[8]   OPTICAL MONITORING OF NON-QUARTERWAVE MULTILAYER FILTERS [J].
VIDAL, B ;
FORNIER, A ;
PELLETIER, E .
APPLIED OPTICS, 1978, 17 (07) :1038-1047