LOW-ENERGY ELECTRON AND ION PROJECTION MICROSCOPY

被引：60
|
作者：
STOCKER, W [1 ]
FINK, HW [1 ]
MORIN, R [1 ]
机构：
[1] CNRS,CRMC2,F-13288 MARSEILLE,FRANCE
来源：
ULTRAMICROSCOPY | 1989年 / 31卷 / 04期
关键词：
D O I：
10.1016/0304-3991(89)90336-7
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
引用
收藏
页码：379 / 384
页数：6
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