LOW-ENERGY ELECTRON AND ION PROJECTION MICROSCOPY

被引：60

作者：

STOCKER, W ^{[1
]}

FINK, HW ^{[1
]}

MORIN, R ^{[1
]}

机构：

[1] CNRS,CRMC2,F-13288 MARSEILLE,FRANCE

来源：

关键词：

D O I：

10.1016/0304-3991(89)90336-7

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：379 / 384

页数：6

共 7 条

[1]

BINNIG G, 1982, HELV PHYS ACTA, V55, P726

[2]

BOERSCH H, 1939, Z TECHN PHYS, V12, P346

[3] POINT-SOURCE FOR IONS AND ELECTRONS [J].

FINK, HW .

PHYSICA SCRIPTA, 1988, 38 (02) :260-263

[4] THEORY OF A SINGLE-ATOM POINT-SOURCE FOR ELECTRONS [J].

LANG, ND ;

YACOBY, A ;

IMRY, Y .

[5] FIELD EMISSION SHADOW MICROSCOPY [J].

MELMED, AJ .

[6] Point projector electron microscope [J].

Morton, GA ;

Ramberg, EG .

PHYSICAL REVIEW, 1939, 56 (07) :705-705

[7]

MUELLER E, 1969, FIELD ION MICROSCOPY, P129