PREDICTION OF THE BIDIRECTIONAL REFLECTANCE-DISTRIBUTION FUNCTION FROM ATOMIC-FORCE AND SCANNING-TUNNELING MICROSCOPE MEASUREMENTS OF INTERFACIAL ROUGHNESS

被引：6

作者：

BRUNO, WM ^{[1
]}

ROTH, JA ^{[1
]}

BURKE, PE ^{[1
]}

HEWITT, WB ^{[1
]}

HOLMBECK, RE ^{[1
]}

NEAL, DG ^{[1
]}

机构：

[1] TRW CO INC,REDONDO BEACH,CA 90278

来源：

APPLIED OPTICS | 1995年 / 34卷 / 07期

关键词：

BIDIRECTIONAL REFLECTANCE DISTRIBUTION FUNCTION; MULTILAYER COATINGS; ATOMIC-FORCE MICROSCOPE; SCANNING-TUNNELING MICROSCOPE; ROUGHNESS POWER SPECTRAL DENSITY;

D O I：

10.1364/AO.34.001229

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Computer codes that are based on Elson's theory for light scattering by interfacial roughness in multilayer coatings were used to predict the bidirectional reflectance-distribution function (BRDF) of several opaque coatings from surface-roughness profiles measured by either a scanning-tunneling microscope or an atomic-force microscope. The predictions usually agreed with measured BRDF values to within a factor of 2. The coatings consisted of single layers of Ag or Ni and dielectric stacks with up to three layers.

引用

页码：1229 / 1238

页数：10

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