SECONDARY EFFECTS IN PROMPT CHARGED-PARTICLE ACTIVATION-ANALYSIS
被引:4
作者:
PEISACH, M
论文数: 0引用数: 0
h-index: 0
机构:
UNIV WITWATERSRAND,DEPT CHEM,WITWATERSRAND 2050,SOUTH AFRICAUNIV WITWATERSRAND,DEPT CHEM,WITWATERSRAND 2050,SOUTH AFRICA
PEISACH, M
[1
]
PILLAY, AE
论文数: 0引用数: 0
h-index: 0
机构:
UNIV WITWATERSRAND,DEPT CHEM,WITWATERSRAND 2050,SOUTH AFRICAUNIV WITWATERSRAND,DEPT CHEM,WITWATERSRAND 2050,SOUTH AFRICA
PILLAY, AE
[1
]
机构:
[1] UNIV WITWATERSRAND,DEPT CHEM,WITWATERSRAND 2050,SOUTH AFRICA
来源:
JOURNAL OF RADIOANALYTICAL AND NUCLEAR CHEMISTRY-LETTERS
|
1991年
/
155卷
/
06期
关键词:
D O I:
10.1007/BF02163639
中图分类号:
O65 [分析化学];
学科分类号:
070302 ;
081704 ;
摘要:
The phenomenon of secondary excitation was observed during irradiation of thick targets of boron and gallium nitride with 2 MeV He-3+ ions. This effect, though negligible during irradiation with protons or He-4+ ions, becomes significant when highly exoergic reactions can occur.