A DESIGN OF PROGRAMMABLE LOGIC-ARRAYS WITH UNIVERSAL TESTS

被引：6

作者：

FUJIWARA, H

KINOSHITA, K

机构：

[1] OSAKA UNIV,DEPT ELECTR ENGN,OSAKA,JAPAN

[2] HIROSHIMA UNIV,DEPT INFORMAT & BEHAV SCI,HIROSHIMA 730,JAPAN

来源：

IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS | 1981年 / 28卷 / 11期

关键词：

D O I：

10.1109/TCS.1981.1084932

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：1027 / 1032

页数：6

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