ATOMISTIC SIMULATION OF FORMATION OF MISFIT DISLOCATIONS IN FCC HETEROSTRUCTURES

被引:14
|
作者
NANDEDKAR, AS [1 ]
机构
[1] IBM CORP, DEPT MODELING, CTR SEMICOND RES & DEV, FISHKILL, NY 12533 USA
来源
ACTA METALLURGICA ET MATERIALIA | 1993年 / 41卷 / 12期
关键词
D O I
10.1016/0956-7151(93)90225-H
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Atomistic simulations were performed to study formation and characteristics of misfit dislocations in heterostructures. The fc.c. Au/Ni (15.9% mismatch) system was used for analysis. When the strain energy of the system, computed using Lennard-Jones potentials [Physica status solidi (a) 30, 619 (1975)], (or potentials based on embedded atom method [Phys. Rev. B 41, 9717 (1990)]) was minimized, misfit dislocations were generated. The dislocation type depended upon the orientation of the substrate, being 90-degrees type for a (001) interface and 60-degrees type for a (111) interface. The latter orientation also resulted in greater relaxation of the strain energy. Multiple dislocations were generated at appropriate spacings in large computational cells relaxed using rigid boundaries. When infinitely large computational cells were simulated using periodic boundaries, the size of the periodic unit affected the dislocation spacing and the energy relaxation. Based on the structure of the intermediate defect configurations, it is hypothesized that the nucleation of misfit dislocations starts with formation of vacancies at the film surface. As the vacancies migrated towards the substrate, a dislocation loop moved to the interface.
引用
收藏
页码:3455 / 3462
页数:8
相关论文
共 50 条
  • [21] Influence of the misfit-dislocation screw component on the formation of threading dislocations in semiconductor heterostructures
    E. M. Trukhanov
    A. V. Kolesnikov
    A. P. Vasilenko
    A. K. Gutakovskii
    Semiconductors, 2002, 36 : 290 - 297
  • [22] Influence of the misfit-dislocation screw component on the formation of threading dislocations in semiconductor heterostructures
    Trukhanov, EM
    Kolesnikov, AV
    Vasilenko, AP
    Gutakovskii, AK
    SEMICONDUCTORS, 2002, 36 (03) : 290 - 297
  • [24] Sources of misfit dislocations in ZnSe/GaAs (001) heterostructures
    Lavagne, S.
    Levade, C.
    Vanderschaeve, G.
    PHYSICA STATUS SOLIDI C - CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 4, NO 8, 2007, 4 (08): : 3015 - +
  • [25] Screw misfit dislocations in soft substrates of epitaxial heterostructures
    Gumen, L
    Feldman, E
    Yurchenko, V
    Krokhin, A
    PHILOSOPHICAL MAGAZINE, 2004, 84 (32) : 3427 - 3438
  • [26] Interaction of cavities with misfit dislocations in SiGe/Si heterostructures
    Follstaedt, DM
    Myers, SM
    Floro, JA
    Lee, SR
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1997, 127 : 375 - 378
  • [27] MISFIT DISLOCATIONS IN INGAAS/INP MBE SINGLE HETEROSTRUCTURES
    FRANZOSI, P
    SALVIATI, G
    GENOVA, F
    STANO, A
    TAIARIOL, F
    JOURNAL OF CRYSTAL GROWTH, 1986, 75 (03) : 521 - 534
  • [28] DYNAMIC OBSERVATIONS OF MISFIT DISLOCATIONS IN STRAINED LAYER HETEROSTRUCTURES
    HULL, R
    BEAN, JC
    BAHNCK, D
    BONAR, JM
    PETICOLAS, LJ
    INSTITUTE OF PHYSICS CONFERENCE SERIES, 1991, (117): : 497 - 508
  • [29] Misfit dislocations in (001) semiconductor heterostructures grown by epitaxy
    Rocher, André
    Snoeck, Etienne
    Materials Science and Engineering B: Solid-State Materials for Advanced Technology, 1999, 67 (01): : 62 - 69
  • [30] Misfit dislocations in epitaxial heterostructures: Mechanisms of generation and multiplication
    Vdovin, VI
    PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 1999, 171 (01): : 239 - 250