SIMULTANEOUS EXTRACTION OF MINORITY-CARRIER TRANSPORT PARAMETERS IN CRYSTALLINE SEMICONDUCTORS BY LATERAL PHOTOCURRENT

被引：7
|
作者：
MISIAKOS, K
WANG, CH
NEUGROSCHEL, A
LINDHOLM, FA
机构：
[1] Electrical Engineering Department, University of Florida, Gainesville
来源：
JOURNAL OF APPLIED PHYSICS | 1990年 / 67卷 / 01期
关键词：
D O I：
10.1063/1.345256
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
The mathematical analysis and parameter-extraction process for a new characterization method are presented. This method allows simultaneous measurement of the minority-carrier lifetime, diffusion coefficient, and diffusion lengths as well as surface recombination velocity. The technique employs semi-infinite two-dimensional photodiodes and uniform, instead of focused, illumination. The paper deals with the derivation of exact closed-form solutions associated with two-dimensional devices and discusses the simultaneous extraction of minority-carrier transport parameters.
引用
收藏
页码：321 / 333
页数：13
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