EFFECT OF MICROVOID SIZE ON POSITRON-ANNIHILATION CHARACTERISTICS AND RESIDUAL RESISTIVITY IN METALS

被引：169
作者：
HAUTOJARVI, P
HEINIO, J
MANNINEN, M
NIEMINEN, R
机构：
[1] HELSINKI UNIV TECHNOL,DEPT TECH PHYS,SF-02150 ESPOO 15,FINLAND
[2] NORDITA,COPENHAGEN,DENMARK
来源：
PHILOSOPHICAL MAGAZINE | 1977年 / 35卷 / 04期
关键词：
D O I：
10.1080/14786437708232638
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：973 / 981
页数：9
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