Carbon Nanowall Field Effect Transistors Using a Self-Aligned Growth Process

被引:4
作者
Kawahara, Toshio [1 ]
Yamaguchi, Satarou [1 ]
Ohno, Yasuhide [2 ]
Maehashi, Kenzo [2 ]
Matsumoto, Kazuhiko [2 ]
Okamoto, Kazumasa [3 ]
Utsunomiya, Risa [4 ]
Matsuba, Teruaki [4 ]
机构
[1] Chubu Univ, Ctr Appl Superconduct & Sustainable Energy Res, 1200 Matsumoto, Aichi 4878501, Japan
[2] Osaka Univ, Inst Sci & Ind Res, Osaka 5670047, Japan
[3] Hokkaido Univ, Fac Engn, Div Quantum Sci & Engn, Sapporo, Hokkaido 0608628, Japan
[4] Nisshin Elect, Ukyo Ku, Kyoto 6158686, Japan
基金
日本科学技术振兴机构;
关键词
Electrical transport measurements; Carbon; Nano structure chemistry; processing and fabrication; Semiconducting films; Nano-electronics and related devices;
D O I
10.1380/ejssnt.2014.225
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Nano-carbons such as carbon nanotubes and graphenes are very promising as next-generation materials, and field effect transistors (FETs) can be used with nano-carbon channels. In these nano-carbon materials, carbon nanowalls (CNWs) are constructed with a few layers of graphene and exhibit properties similar to those of graphene. We have developed a self-aligned process for CNWs using grapho-epitaxy. We have grown CNW channels on several line and space patterns fabricated by electron beam lithography and reactive ion etching. When the line and space pattern is suitable, self-aligned CNWs can be made by plasma-enhanced CVD. We also discuss the electrical properties (IDs-Vps characteristics) of the self-aligned CNW-FETs resulting from several growth temperatures and deposition times.
引用
收藏
页码:225 / 229
页数:5
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