BEAM PHENOMENA AT AND NEAR CRITICAL INCIDENCE UPON A DIELECTRIC INTERFACE

被引：47

作者：

CHAN, CC ^{[1
]}

TAMIR, T ^{[1
]}

机构：

[1] POLYTECH UNIV,DEPT ELECT ENGN & COMP SCI,BROOKLYN,NY 11201

来源：

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION | 1987年 / 4卷 / 04期

关键词：

D O I：

10.1364/JOSAA.4.000655

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

收藏

页码：655 / 663

页数：9

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