PROTON NMR-STUDIES OF ANNEALED PLASMA-DEPOSITED AMORPHOUS SI-H FILMS

被引：72

作者：

REIMER, JA ^{[1
]}

VAUGHAN, RW ^{[1
]}

KNIGHTS, JC ^{[1
]}

机构：

[1] XEROX CORP,PALO ALTO RES CTR,PALO ALTO,CA 94304

来源：

SOLID STATE COMMUNICATIONS | 1981年 / 37卷 / 02期

关键词：

D O I：

10.1016/0038-1098(81)90734-1

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

引用

页码：161 / 164

页数：4

共 7 条

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[2]

BRODSKY MH, 1977, PHYS REV B, V16, P3550

[3] STRUCTURAL INTERPRETATION OF THE VIBRATIONAL-SPECTRA OF A-SI-H ALLOYS [J].

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NEMANICH, RJ ;

KNIGHTS, JC .

PHYSICAL REVIEW B, 1979, 19 (04) :2064-2073

[4] PROTON MAGNETIC-RESONANCE SPECTRA OF PLASMA-DEPOSITED AMORPHOUS SI-H FILMS [J].

REIMER, JA ;

VAUGHAN, RW ;

KNIGHTS, JC .

PHYSICAL REVIEW LETTERS, 1980, 44 (03) :193-196

[5] LUMINESCENCE STUDIES OF PLASMA-DEPOSITED HYDROGENATED SILICON [J].

STREET, RA ;

KNIGHTS, JC ;

BIEGELSEN, DK .

PHYSICAL REVIEW B, 1978, 18 (04) :1880-1891

[6] EFFECT OF ANNEALING ON THE OPTICAL-PROPERTIES OF PLASMA DEPOSITED AMORPHOUS HYDROGENATED SILICON [J].

TSAI, CC ;

FRITZSCHE, H .

SOLAR ENERGY MATERIALS, 1979, 1 (1-2) :29-42

[7] SIMPLE, LOW-POWER, MULTIPLE PULSE NMR SPECTROMETER [J].

VAUGHAN, RW ;

STACEY, LM ;

LEE, JW ;

ELLEMAN, DD ;

RHIM, WK .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1972, 43 (09) :1356-&

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