PROTON NMR-STUDIES OF ANNEALED PLASMA-DEPOSITED AMORPHOUS SI-H FILMS

被引：72

作者：

REIMER, JA ^{[1
]}

VAUGHAN, RW ^{[1
]}

KNIGHTS, JC ^{[1
]}

机构：

[1] XEROX CORP,PALO ALTO RES CTR,PALO ALTO,CA 94304

来源：

关键词：

D O I：

10.1016/0038-1098(81)90734-1

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

引用

页码：161 / 164

页数：4

共 7 条

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[2] BRODSKY MH, 1977, PHYS REV B, V16, P3550
[3] STRUCTURAL INTERPRETATION OF THE VIBRATIONAL-SPECTRA OF A-SI-H ALLOYS
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[J]. PHYSICAL REVIEW B, 1979, 19 (04): : 2064 - 2073
[4] PROTON MAGNETIC-RESONANCE SPECTRA OF PLASMA-DEPOSITED AMORPHOUS SI-H FILMS
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VAUGHAN, RW
KNIGHTS, JC
[J]. PHYSICAL REVIEW LETTERS, 1980, 44 (03) : 193 - 196
[5] LUMINESCENCE STUDIES OF PLASMA-DEPOSITED HYDROGENATED SILICON
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BIEGELSEN, DK
[J]. PHYSICAL REVIEW B, 1978, 18 (04): : 1880 - 1891
[6] EFFECT OF ANNEALING ON THE OPTICAL-PROPERTIES OF PLASMA DEPOSITED AMORPHOUS HYDROGENATED SILICON
TSAI, CC
FRITZSCHE, H
[J]. SOLAR ENERGY MATERIALS, 1979, 1 (1-2): : 29 - 42
[7] SIMPLE, LOW-POWER, MULTIPLE PULSE NMR SPECTROMETER
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LEE, JW
ELLEMAN, DD
RHIM, WK
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1972, 43 (09) : 1356 - &