A SEM-EBIC MINORITY-CARRIER LIFETIME-MEASUREMENT TECHNIQUE

被引：23

作者：

IOANNOU, DE ^{[1
]}

机构：

[1] UNIV MANCHESTER,INST SCI & TECHNOL,DEPT ELECT ENGN & ELECTR,MANCHESTER M60 1QD,LANCASHIRE,ENGLAND

来源：

JOURNAL OF PHYSICS D-APPLIED PHYSICS | 1980年 / 13卷 / 04期

关键词：

D O I：

10.1088/0022-3727/13/4/014

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：611 / &

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