A SEM-EBIC MINORITY-CARRIER LIFETIME-MEASUREMENT TECHNIQUE

被引：23
|
作者：
IOANNOU, DE [1 ]
机构：
[1] UNIV MANCHESTER,INST SCI & TECHNOL,DEPT ELECT ENGN & ELECTR,MANCHESTER M60 1QD,LANCASHIRE,ENGLAND
来源：
JOURNAL OF PHYSICS D-APPLIED PHYSICS | 1980年 / 13卷 / 04期
关键词：
D O I：
10.1088/0022-3727/13/4/014
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
收藏
页码：611 / &
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