POLARIZATION CHARACTERISTICS OF LIGHT PASSING THROUGH ELLIPTICALLY BIREFRINGENT-CRYSTAL

[1] AGRANOVICH VM, 1965, KRISTALLOOPTIKA UCHE

[2] AZZAM R, 1981, ELLIPSOMETRIYA POLYA

[3] LOCI OF INVARIANT-AZIMUTH AND INVARIANT-ELLIPTICITY POLARIZATION STATES OF AN OPTICAL SYSTEM [J]. APPLIED OPTICS, 1973, 12 (01): : 62 - 67

[4] BEREZHNOI IV, 1987, OPTIKA ANIZOTROPNYKH, P77

[5] EFFECTS OF POLARIZER ELLIPTICITY ON ELLIPSOMETRY MEASUREMENTS [J]. SURFACE SCIENCE, 1970, 20 (02) : 355 - &

[6] A NEW OPTICAL METHOD AND APPARATUS HAUP FOR MEASURING SIMULTANEOUSLY OPTICAL-ACTIVITY AND BIREFRINGENCE OF CRYSTALS .1. PRINCIPLES AND CONSTRUCTION [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1983, 16 (APR) : 204 - 211

[7] NEW METHOD FOR MEASURING OPTICAL-ACTIVITY OF CRYSTALS AND OPTICAL-ACTIVITY OF KH2PO4 [J]. JOURNAL OF APPLIED PHYSICS, 1978, 49 (02) : 809 - 815

[8] Konstantinova A. F., 1969, Kristallografiya, V14, P283

[9] TRONKO VD, 1973, OPT SPEKTROSK+, V34, P1157

[10] Vlokh O. G., 1973, Ukrayins'kyi Fizychnyi Zhurnal, V18, P2060

[1] AGRANOVICH VM, 1965, KRISTALLOOPTIKA UCHE

[2] AZZAM R, 1981, ELLIPSOMETRIYA POLYA

[3] LOCI OF INVARIANT-AZIMUTH AND INVARIANT-ELLIPTICITY POLARIZATION STATES OF AN OPTICAL SYSTEM [J]. APPLIED OPTICS, 1973, 12 (01): : 62 - 67

[4] BEREZHNOI IV, 1987, OPTIKA ANIZOTROPNYKH, P77

[5] EFFECTS OF POLARIZER ELLIPTICITY ON ELLIPSOMETRY MEASUREMENTS [J]. SURFACE SCIENCE, 1970, 20 (02) : 355 - &

[6] A NEW OPTICAL METHOD AND APPARATUS HAUP FOR MEASURING SIMULTANEOUSLY OPTICAL-ACTIVITY AND BIREFRINGENCE OF CRYSTALS .1. PRINCIPLES AND CONSTRUCTION [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1983, 16 (APR) : 204 - 211

[7] NEW METHOD FOR MEASURING OPTICAL-ACTIVITY OF CRYSTALS AND OPTICAL-ACTIVITY OF KH2PO4 [J]. JOURNAL OF APPLIED PHYSICS, 1978, 49 (02) : 809 - 815

[8] Konstantinova A. F., 1969, Kristallografiya, V14, P283

[9] TRONKO VD, 1973, OPT SPEKTROSK+, V34, P1157

[10] Vlokh O. G., 1973, Ukrayins'kyi Fizychnyi Zhurnal, V18, P2060