Using Deep Learning to Challenge Safety Standard for Highly Autonomous Machines in Agriculture

被引:43
作者
Steen, Kim Arild [1 ]
Christiansen, Peter [1 ]
Karstoft, Henrik [1 ]
Jorgensen, Rasmus Nyholm [1 ]
机构
[1] Aarhus Univ, Dept Engn, Finlandsgade 22, DK-8200 Aarhus N, Denmark
关键词
deep learning; obstacle detection; autonomous; ISO;
D O I
10.3390/jimaging2010006
中图分类号
TB8 [摄影技术];
学科分类号
0804 ;
摘要
In this paper, an algorithm for obstacle detection in agricultural fields is presented. The algorithm is based on an existing deep convolutional neural net, which is fine-tuned for detection of a specific obstacle. In ISO/DIS 18497, which is an emerging standard for safety of highly automated machinery in agriculture, a barrel-shaped obstacle is defined as the obstacle which should be robustly detected to comply with the standard. We show that our fine-tuned deep convolutional net is capable of detecting this obstacle with a precision of 99.9% in row crops and 90.8% in grass mowing, while simultaneously not detecting people and other very distinct obstacles in the image frame. As such, this short note argues that the obstacle defined in the emerging standard is not capable of ensuring safe operations when imaging sensors are part of the safety system.
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页数:8
相关论文
共 12 条
  • [1] [Anonymous], VERY DEEP CONVOLUTIO
  • [2] [Anonymous], 18497 ISODIS
  • [3] Christiansen P., 2015, PRECIS AGRIC, V15, P1330
  • [4] Farfade S.S., MULTIVIEW FACE DETEC
  • [5] Caffe: Convolutional Architecture for Fast Feature Embedding
    Jia, Yangqing
    Shelhamer, Evan
    Donahue, Jeff
    Karayev, Sergey
    Long, Jonathan
    Girshick, Ross
    Guadarrama, Sergio
    Darrell, Trevor
    [J]. PROCEEDINGS OF THE 2014 ACM CONFERENCE ON MULTIMEDIA (MM'14), 2014, : 675 - 678
  • [6] Koestinger M., 2011, P 1 IEEE INT WORKSH
  • [7] ImageNet Classification with Deep Convolutional Neural Networks
    Krizhevsky, Alex
    Sutskever, Ilya
    Hinton, Geoffrey E.
    [J]. COMMUNICATIONS OF THE ACM, 2017, 60 (06) : 84 - 90
  • [8] Gradient-based learning applied to document recognition
    Lecun, Y
    Bottou, L
    Bengio, Y
    Haffner, P
    [J]. PROCEEDINGS OF THE IEEE, 1998, 86 (11) : 2278 - 2324
  • [9] Long J, FULLY CONVOLUTIONAL
  • [10] Redmon J., YOU ONLY LOOK ONCE U