MONTE-CARLO CALCULATION APPROACH TO QUANTITATIVE AUGER-ELECTRON SPECTROSCOPY

被引：86
作者：
ICHIMURA, S
ARATAMA, M
SHIMIZU, R
机构：
来源：
JOURNAL OF APPLIED PHYSICS | 1980年 / 51卷 / 05期
关键词：
D O I：
10.1063/1.327953
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
引用
收藏
页码：2853 / 2860
页数：8
相关论文
共 40 条
[1]   MONTE-CARLO SIMULATION OF ELECTRON PENETRATION THROUGH THIN-FILMS OF PMMA [J].
ADESIDA, I ;
SHIMIZU, R ;
EVERHART, TE .
APPLIED PHYSICS LETTERS, 1978, 33 (10) :849-850
[2]   QUANTITATIVE-ANALYSIS OF ALXGA1-XAS BY AUGER-ELECTRON SPECTROSCOPY [J].
ARTHUR, JR ;
LEPORE, JJ .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1977, 14 (04) :979-984
[3]   ESTIMATES OF EFFICIENCIES OF PRODUCTION AND DETECTION OF ELECTRON-EXCITED AUGER EMISSION [J].
BISHOP, HE ;
RIVIERE, JC .
JOURNAL OF APPLIED PHYSICS, 1969, 40 (04) :1740-&
[4]   ANALYTICAL EXPRESSIONS FOR POTENTIALS OF NEUTRAL THOMAS-FERMI-DIRAC ATOMS AND FOR CORRESPONDING ATOMIC SCATTERING FACTORS FOR X RAYS AND ELECTRONS [J].
BONHAM, RA ;
STRAND, TG .
JOURNAL OF CHEMICAL PHYSICS, 1963, 39 (09) :2200-&
[5]  
CHANG CC, 1974, CHARACTERIZATION SOL, pCH20
[6]  
FINK M, 1974, 160 U TEX EL RES CTR
[7]  
FINK M, 1970, 88 U TEX EL RES CTR
[8]   TRANSMISSION, ENERGY-DISTRIBUTION, AND SE EXCITATION OF FAST ELECTRONS IN THIN SOLID FILMS [J].
FITTING, HJ .
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1974, 26 (02) :525-535
[9]   MONTE-CARLO CALCULATION OF THE SECONDARY-ELECTRON EMISSION OF NORMAL METALS .1. MODEL [J].
GANACHAUD, JP ;
CAILLER, M .
SURFACE SCIENCE, 1979, 83 (02) :498-518
[10]   SCATTERING OF 2-20 KEV ELECTRONS IN ALUMINUM [J].
GREEN, AJ ;
LECKEY, RCG .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1976, 9 (14) :2123-2138
1234