FORMULATION OF THE DRIFT RELIABILITY OPTIMIZATION PROBLEM

被引：23

作者：

STYBLINSKI, MA

机构：

[1] Department of Electrical Engineering, Texas A and M University College Station

来源：

MICROELECTRONICS AND RELIABILITY | 1991年 / 31卷 / 01期

关键词：

D O I：

10.1016/0026-2714(91)90360-J

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Drift Reliabilty (DR) of a system is related to that part of the overal system reliability that is concerned with the system element ageing and parameter dependence on such environmental conditions as temperature, level of radiation, humidity, etc. Its maximization during the system design phase is of great economic importance for the human manufacturers of electronic products and other equipment. In this paper the DR optimization problem is mathematically formulated in the context of parametric manufacturing yield optimization, and some algorithmic aspects of its solution are discussed. It is shown that it is possible to formulate the problem in such a way that some measures of both the yield and the average time to failure (due to the system element drift) can be maximized, and different trade-off situations investigated. The existing efficient gradient based yield optimization algorithms can be used after only some relatively simple modifications of the gradient estimation formulas.

引用

页码：159 / 171

页数：13

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