共 20 条
- [1] MEASUREMENT OF THE SCATTERING FACTOR PHASE AND THE SPHERICAL AND ASTIGMATIC ABERRATION CONSTANTS FROM DIFFRACTOGRAMS OF ELECTRON-MICROGRAPHS JOURNAL OF ELECTRON MICROSCOPY, 1980, 29 (03): : 276 - 277
- [2] FURTHER IMPROVED MEASUREMENT OF THE ANGULAR-DEPENDENCE OF COMPLEX SCATTERING FACTOR PHASE AND THE ABERRATION COEFFICIENT AS WELL AS THE PARTIAL COHERENCE ANGLE FROM DIFFRACTOGRAMS OF ELECTRON-MICROGRAPHS JOURNAL OF ELECTRON MICROSCOPY, 1981, 30 (03): : 229 - 230
- [4] METHOD FOR DETERMINATION OF ANGLE OF ILLUMINATION FROM OPTICAL DIFFRACTOGRAMS OF ELECTRON-MICROGRAPHS JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1977, 2 (03): : A7 - A7
- [6] COMPUTER-AIDED RECONSTRUCTION OF THE IMAGE-CONTRAST OF ATOM CLUSTERS FROM DIFFRACTOGRAMS OF ELECTRON-MICROGRAPHS JOURNAL OF ELECTRON MICROSCOPY, 1980, 29 (03): : 318 - 319
- [9] MEASUREMENT OF INTRINSIC BOUNDARY DISLOCATION SPACINGS FROM ELECTRON-MICROGRAPHS SCRIPTA METALLURGICA, 1976, 10 (07): : 585 - 588
- [10] CILIARY ORIENTATION - REPRODUCIBLE MEASUREMENT FROM ELECTRON-MICROGRAPHS OF RESPIRATORY CILIA JOURNAL OF ULTRASTRUCTURE AND MOLECULAR STRUCTURE RESEARCH, 1986, 94 (03): : 293 - 293