SIMPLIFIED MATHEMATICAL APPROACH TO XRF SECONDARY EXCITATION

被引：6

作者：

BUI, C

MILAZZO, M

SIRONI, C

机构：

[1] Istituto di Fisica Generale Applicata, Università degli Studi di Milano, Milan

来源：

X-RAY SPECTROMETRY | 1993年 / 22卷 / 01期

关键词：

D O I：

10.1002/xrs.1300220106

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

A secondary effect simplified mathematical expression (SESME) was developed to calculate, in a very simple way, the XRF enhancement effect by secondary excitation. This approximate method makes possible the use of a simple algorithm in the case of a finite thickness sample also. The numerical approximations are quantitatively estimated for samples of infinite thickness and the physical meaning of the formal expression is discussed.

引用

页码：17 / 22

页数：6

共 6 条

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[6]

HDB CHEM PHYSICS

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