THIN-FILM PULSE-PROPAGATION ANALYSIS USING FREQUENCY TECHNIQUES

被引:4
作者
HWANG, LT [1 ]
NAYAK, D [1 ]
TURLIK, I [1 ]
REISMAN, A [1 ]
机构
[1] N CAROLINA STATE UNIV,DEPT ELECT & COMP ENGN,RALEIGH,NC 27695
来源
IEEE TRANSACTIONS ON COMPONENTS HYBRIDS AND MANUFACTURING TECHNOLOGY | 1991年 / 14卷 / 01期
关键词
D O I
10.1109/33.76531
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
High-speed pulse (rise time = 100 ps) propagation in a thin-film multichip package is analyzed in this paper. The thin-film lines were assumed to be 8 mu-m wide, 4 mu-m thick, 12 mu-m above the ground, and made of copper embedded in a dielectric medium with a dielectric constant of 3.5 (e.g., polyimide). Weeks' algorithm was used to calculate the wideband line characteristics which include the skin effect of conductors, and the proximity effect of the ground up to a frequency of 10 GHz. We have assumed that the dielectric imperfection and the conductor surface roughness are negligible for this study. An inverse fast Fourier transform (FFT) algorithm was employed to obtain the time-domain results. Line lengths studied ranged from 1 to 15 cm, and three types of terminations were treated: parallel, series, and open. Termination strategy for different line lengths is presented first. The maximum line length allowable in the thin-film conductor system is then examined. Finally, crosstalk at various locations of the quiet lines with different terminations is discussed.
引用
收藏
页码:192 / 198
页数:7
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