HIGH SENSITIVITY AUGER ELECTRON SPECTROMETER

被引:194
作者
PALMBERG, PW
BOHN, GK
TRACY, JC
机构
关键词
D O I
10.1063/1.1652989
中图分类号
O59 [应用物理学];
学科分类号
摘要
An Auger electron spectrometer for studies of solid surfaces which is considerably more sensitive than currently used instruments has been developed. The greatly improved signal-to-noise ratio of the spectrometer made it possible to display the 0-1000 eV Auger spectrum on an oscilloscope at a scanning rate of 20 000 V/sec. Alternatively, the scanning rate may be reduced to that typical of present instruments (∼2 V/sec) and the primary beam current reduced from 5 × 10-5 to 10-8 A. © 1969 The American Institute of Physics.
引用
收藏
页码:254 / &
相关论文
共 50 条
[21]   (e, 2e) electron momentum spectrometer with high sensitivity and high resolution [J].
Ren, XG ;
Ning, CG ;
Deng, JK ;
Zhang, SF ;
Su, GL ;
Huang, F ;
Li, GQ .
REVIEW OF SCIENTIFIC INSTRUMENTS, 2005, 76 (06)
[22]   AUGER ELECTRON SPECTROMETER AS A TOOL FOR SURFACE ANALYSIS (CONTAMINATION MONITOR) [J].
TAYLOR, NJ .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1969, 6 (01) :241-&
[23]   IMPROVED AUGER-ELECTRON SPECTROMETER USING CONCENTRIC HEMISPHERES [J].
BASSETT, PJ .
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1974, 7 (06) :461-463
[24]   DESIGN OF A HIGH-PERFORMANCE AUGER SPECTROMETER FOR THE STEM [J].
FENG, OY ;
ISAACSON, M .
ULTRAMICROSCOPY, 1989, 28 (1-4) :201-204
[25]   CHARACTERIZATION OF THE CHROMIUM-OXYGEN BOUNDING STUDIED BY HIGH-RESOLUTION AUGER-ELECTRON SPECTROMETER [J].
JARDIN, C ;
GAUTHIER, JP ;
MICHEL, P .
JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1979, 4 (01) :55-62
[26]   Application of high-ε ceramics for enhanced sensitivity of electron paramagnetic resonance spectrometer [J].
Geifman, Ilia N. ;
Golovina, Iryna S. ;
Belous, Anatoliy G. .
TMS 2008 ANNUAL MEETING SUPPLEMENTAL PROCEEDINGS, VOL 1: MATERIALS PROCESSING AND PROPERTIES, 2008, :491-+
[27]   Hi high-sensitivity detector for the neutrino investigations on the electron magnetic spectrometer [J].
Sapozhnikov, G. V. ;
Kholzakov, A. V. ;
Shabanova, I. N. ;
Kazantzev, A. E. .
XXIII CONFERENCE ON NEUTRINO PHYSICS AND ASTROPHYSICS, 2008, 136
[28]   OBSERVATIONS OF ELECTRON CHANNELING PATTERNS IN AN AUGER-ELECTRON SPECTROMETER WITH SCANNING SAMPLE POSITIONER [J].
SEILER, H ;
KUHNLE, G ;
BAUER, H .
APPLIED PHYSICS, 1975, 6 (02) :167-171
[29]   COMBINED AUGER-ELECTRON SPECTROMETER AND REVERSE-VIEWING DIFFRACTOMETER [J].
ANTIPOV, VG ;
BOLSHUNOV, IB ;
ROMANOV, SS .
INSTRUMENTS AND EXPERIMENTAL TECHNIQUES, 1990, 33 (04) :898-901
[30]   DATA ACQUISITION-SYSTEM FOR SCANNING AUGER ATTACHMENT TO ELECTRON SPECTROMETER [J].
EGOROV, NV ;
KARPOV, AG ;
YANOVSKII, VV .
INSTRUMENTS AND EXPERIMENTAL TECHNIQUES, 1985, 28 (02) :376-377