POWDER DIFFRACTION USING IMAGING PLATES AT THE AUSTRALIAN NATIONAL BEAMLINE FACILITY AT THE PHOTON FACTORY

被引:31
作者
GARRETT, RF
COOKSON, DJ
FORAN, GJ
SABINE, TM
KENNEDY, BJ
WILKINS, SW
机构
[1] UNIV SYDNEY,SCH CHEM,SYDNEY,NSW 2006,AUSTRALIA
[2] CSIRO,DIV MAT SCI & TECHNOL,CLAYTON,VIC 3168,AUSTRALIA
关键词
D O I
10.1063/1.1145972
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
A novel x-ray diffractometer was installed at the Australian National Beamline Facility at the Photon Factory, Japan, in October 1993. One of the major capabilities of the instrument is high speed high resolution powder diffraction using imaging plate detectors. The diffractometer combines a two circle goniometer and a large cassette in which imaging plates can be loaded covering 320° of 2θ. The diffractometer is enclosed in a large vacuum chamber and can be operated in air, vacuum, or helium. Recently, powder data has been obtained from rutile (TiO2) and NBS Si 640b at wavelengths from 0.62 to 1.9 Å using imaging plates, and has been used to characterize the performance of the instrument. The data has been refined using the Rietveld method and R values of under 2% obtained. The resolution of the system varies from a minimum of about 0.04° to around 0.25° at 2θ angles around 160°, which is the equal of most synchrotron based powder diffractometers, and only slightly worse than that obtained using an analyzer crystal and scintillation detector. Using the imaging plates, 160° of data is simultaneously acquired in an exposure of about 10 min, compared to conventional counter diffractometer scans which routinely exceed 10 hours. © 1995 American Institute of Physics.
引用
收藏
页码:1351 / 1353
页数:3
相关论文
共 9 条
[1]   IMAGING PLATE ILLUMINATES MANY FIELDS [J].
AMEMIYA, Y ;
MIYAHARA, J .
NATURE, 1988, 336 (6194) :89-90
[2]   ON THE DESIGN OF A HIGH-SPEED COMBINED HIGH-RESOLUTION POWDER DIFFRACTOMETER AND SMALL-ANGLE SCATTERING SYSTEM WITH TIME-RESOLUTION CAPABILITY BASED ON THE USE OF IMAGING PLATES AND CCCC MONOCHROMATORS [J].
BARNEA, Z ;
CLAPP, R ;
CREAGH, DC ;
SABINE, TM ;
STEVENSON, AW ;
WHITE, JW ;
WILKINS, SW ;
HARADA, J ;
HASHIZUME, H ;
KASHIHARA, Y ;
SAKATA, M ;
OHSUMI, K ;
ZEMB, T .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1989, 60 (07) :2537-2540
[3]   THE AUSTRALIAN DIFFRACTOMETER AT THE PHOTON FACTORY [J].
BARNEA, Z ;
CREAGH, DC ;
DAVIS, TJ ;
GARRETT, RF ;
JANKY, S ;
STEVENSON, AW ;
WILKINS, SW .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1992, 63 (01) :1069-1072
[4]  
GARRETT RF, 1995, REV SCI INSTRUMENT 2, V66
[5]  
HILL RJ, M112 AUSTR AT EN COM
[6]   STRUCTURAL AND THERMAL PARAMETERS FOR RUTILE AND ANATASE [J].
HOWARD, CJ ;
SABINE, TM ;
DICKSON, F .
ACTA CRYSTALLOGRAPHICA SECTION B-STRUCTURAL SCIENCE, 1991, 47 :462-468
[7]  
LARSON AC, LAUR86748 LSO AL REP
[8]   A NEW TYPE OF X-RAY AREA DETECTOR UTILIZING LASER STIMULATED LUMINESCENCE [J].
MIYAHARA, J ;
TAKAHASHI, K ;
AMEMIYA, Y ;
KAMIYA, N ;
SATOW, Y .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1986, 246 (1-3) :572-578
[9]  
SABINE TM, UNPUB J APPL CRYSTAL