DIELECTRIC MATERIALS FOR USE AS OUTPUT WINDOW IN HIGH-POWER KLYSTRONS

被引:46
作者
MICHIZONO, S
SAITO, Y
YAMAGUCHI, S
ANAMI, S
MATUDA, N
KINBARA, A
机构
[1] TOKYO DENKI UNIV,FAC ENGN,TOKYO 101,JAPAN
[2] UNIV TOKYO,DEPT APPL PHYS,TOKYO 113,JAPAN
来源
IEEE TRANSACTIONS ON ELECTRICAL INSULATION | 1993年 / 28卷 / 04期
关键词
D O I
10.1109/14.231552
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The breakdown of rf windows used in high-power klystrons is one of the most serious problems in the development of klystrons. In this paper, the durability of several dielectric materials used for rf windows is discussed in terms of secondary electron emission (SEE), cathodoluminescence, and dielectric loss. High-power tests of these materials with TiN coatings, thus having low SEE, were also carried out using a traveling wave resonant ring. The results show that alumina ceramics are superior to sapphire and aluminum nitride. The origin of breakdown was investigated and the requirements for rf window materials presented.
引用
收藏
页码:692 / 699
页数:8
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