ION-BEAM PROBING SYSTEM FOR LABORATORY PLASMAS

被引：0

作者：

REINOVSKY, RE ^{[1
]}

JENNINGS, WC ^{[1
]}

HICKOK, R ^{[1
]}

机构：

[1] RENSSELAER POLYTECH INST, TROY, NY USA

来源：

BULLETIN OF THE AMERICAN PHYSICAL SOCIETY | 1972年 / 17卷 / 11期

关键词：

D O I：

暂无

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：985 / 986

页数：2

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