SELF-CONSISTENT CALCULATION OF COMPTON PROFILES, X-RAY STRUCTURE FACTORS, AND BAND-STRUCTURE FOR SILICON

被引：10

作者：

HEATON, JM ^{[1
]}

LAFON, E ^{[1
]}

机构：

[1] OKLAHOMA STATE UNIV,DEPT PHYS,STILLWATER,OK 74078

来源：

JOURNAL OF PHYSICS C-SOLID STATE PHYSICS | 1981年 / 14卷 / 04期

关键词：

D O I：

10.1088/0022-3719/14/4/010

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

引用

收藏

页码：347 / 351

页数：5

相关论文

共 13 条

[1] ELECTRON-DISTRIBUTION IN SILICON .2. THEORETICAL INTERPRETATION
ALDRED, PJE
HART, M
[J]. PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1973, 332 (1589) : 239 - 254
[2] PHOTOEMISSION VALENCE-BAND DENSITIES OF STATES FOR SI, GE, AND GAAS USING SYNCHROTRON RADIATION
GROBMAN, WD
EASTMAN, DE
[J]. PHYSICAL REVIEW LETTERS, 1972, 29 (22) : 1508 - &
[3] SELF-CONSISTENT CALCULATION OF COMPTON PROFILES, X-RAY STRUCTURE FACTORS, AND BAND-STRUCTURE FOR DIAMOND
HEATON, R
LAFON, E
[J]. PHYSICAL REVIEW B, 1978, 17 (04): : 1958 - 1969
[4] SELF-CONSISTENT EQUATIONS INCLUDING EXCHANGE AND CORRELATION EFFECTS
KOHN, W
SHAM, LJ
[J]. PHYSICAL REVIEW, 1965, 140 (4A): : 1133 - &
[5] X-RAY PHOTOEMISSION SPECTRA OF CRYSTALLINE AND AMORPHOUS SI AND GE VALENCE BANDS
LEY, L
SHIRLEY, DA
POLLAK, R
KOWALCZYK, S
[J]. PHYSICAL REVIEW LETTERS, 1972, 29 (16) : 1088 - +
[6] FINE STRUCTURE IN THE ABSORPTION-EDGE SPECTRUM OF SI
MACFARLANE, GG
MCLEAN, TP
QUARRINGTON, JE
ROBERTS, V
[J]. PHYSICAL REVIEW, 1958, 111 (05): : 1245 - 1254
[7] GAMMA-RAY COMPTON PROFILES OF DIAMOND, SILICON, AND GERMANIUM
REED, WA
EISENBERGER, P
[J]. PHYSICAL REVIEW B, 1972, 6 (12) : 4596 - 4604
[8] MOMENTUM DENSITIES AND COMPTON PROFILES OF DIAMOND, SILICON AND SILICON-CARBIDE
SETH, A
ELLIS, DE
[J]. JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1977, 10 (02): : 181 - 194
[9] SLATER JC, 1974, QUANTUM THEORY MOL S, V4, P21
[10] SPICER WE, 1968, 9 P INT C PHYS SEM, V1, P61