EXAFS STUDIES ON SUPERFICIAL REGIONS BY MEANS OF TOTAL REFLECTION

被引：81

作者：

MARTENS, G

RABE, P

机构：

来源：

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1980年 / 58卷 / 02期

关键词：

D O I：

10.1002/pssa.2210580212

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：415 / 424

页数：10

共 18 条

[1] X-RAY PHOTOABSORPTION OF SOLIDS BY SPECULAR REFLECTION [J].

BARCHEWITZ, R ;

CREMONESEVISICATO, M ;

ONORI, G .

JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1978, 11 (21) :4439-4445

[2] EXTENDED X-RAY-ABSORPTION FINE-STRUCTURE OF SURFACE ATOMS ON SINGLE-CRYSTAL SUBSTRATES - IODINE ADSORBED ON AG(111) [J].

CITRIN, PH ;

EISENBERGER, P ;

HEWITT, RC .

PHYSICAL REVIEW LETTERS, 1978, 41 (05) :309-312

[3]

DELCUETO JA, 1978, J PHYS C SOLID STATE, V11, pL833, DOI 10.1088/0022-3719/11/20/003

[4]

FREUND A, 1975, ANOMALOUS SCATTERING

[5] MEASUREMENTS OF X-RAY ANOMALOUS SCATTERING FACTORS NEAR THE CU K ABSORPTION-EDGE BY THE USE OF SYNCHROTRON RADIATION [J].

FUKAMACHI, T ;

HOSOYA, S ;

KAWAMURA, T ;

HUNTER, S ;

NAKANO, Y .

JAPANESE JOURNAL OF APPLIED PHYSICS, 1978, 17 :326-328

[6] EXTENDED-X-RAY-ABSORPTION-FINE-STRUCTURE STUDY OF BR2-GRAPHITE SYSTEM [J].

HEALD, SM ;

STERN, EA .

PHYSICAL REVIEW B, 1978, 17 (10) :4069-4081

[7] APPLICATION OF THE DISPERSION-RELATION TO DETERMINE THE ANOMALOUS SCATTERING FACTORS [J].

KAWAMURA, T ;

FUKAMACHI, T .

JAPANESE JOURNAL OF APPLIED PHYSICS, 1978, 17 :224-226

[8] NEW APPLICATION OF EXTENDED X-RAY ABSORPTION FINE-STRUCTURE (EXAFS) AS A SURFACE PROBE-NATURE OF OXYGEN INTERACTION WITH A RUTHENIUM CATALYST [J].

LYTLE, FW ;

VIA, GH ;

SINFELT, JH .

JOURNAL OF CHEMICAL PHYSICS, 1977, 67 (08) :3831-3832

[9] EXAFS IN PHOTOELECTRON YIELD SPECTRA AT K EDGES OF CU, NI, AND GE [J].

MARTENS, G ;

RABE, P ;

TOLKIEHN, G ;

WERNER, A .

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1979, 55 (01) :105-108

[10] IMPROVED EXTENDED-X-RAY-ABSORPTION FINE-STRUCTURE (EXAFS) STUDIES APPLIED TO INVESTIGATION OF CU-O, CU-N, AND CU-BR BOND LENGTHS [J].

MARTENS, G ;

RABE, P ;

SCHWENTNER, N ;

WERNER, A .

PHYSICAL REVIEW B, 1978, 17 (04) :1481-1488

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