DETERMINATION OF STRAIN CONCENTRATION BY MICROFLUORESCENT DENSITOMETRY OF X-RAY TOPOGRAPHY - A BRIDGE BETWEEN MICRO-FRACTURE AND CONTINUUM-MECHANICS

被引：7

作者：

KALMAN, ZH ^{[1
]}

CHAUDHURI, J ^{[1
]}

WENG, GJ ^{[1
]}

WEISSMANN, S ^{[1
]}

机构：

[1] RUTGERS STATE UNIV,COLL ENGN,DEPT MECH & MAT SCI,PISCATAWAY,NJ 08854

来源：

关键词：

D O I：

10.1107/S0021889880012083

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：290 / 296

页数：7

共 10 条

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[2] BAILEY GW, 1976, 34TH P ANN M EL MICR, P586
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[5] BRUMMER O, 1976, DYNAMISCHE INTERFERE, P99
[6] GRONSKY R, 1975, 33RD ANN P EL MICR S, P22
[7] DETERMINATION OF STRAIN DISTRIBUTION IN ELASTICALLY BENT MATERIALS BY X-RAY-INTENSITY MEASUREMENT
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WEISSMANN, S
[J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1979, 12 (APR) : 209 - 220
[8] NEUBER H, 1958, KERBSPANNUNGSLEHRE, P58
[9] OPTICAL DIFFRACTION FROM LATTICE IMAGES OF ALLOYS
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GRONSKY, R
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[J]. ACTA METALLURGICA, 1976, 24 (09): : 789 - 796
[10] Tanner B. K., 1976, XRAY DIFFRACTION TOP, P100