A SENSITIVE SPECTROPHOTOMETER FOR OPTICAL REFLECTANCE AND TRANSMITTANCE MEASUREMENTS

被引：49
作者：
SELL, DD
机构：
来源：
APPLIED OPTICS | 1970年 / 9卷 / 08期
关键词：
D O I：
10.1364/AO.9.001926
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
引用
收藏
页码：1926 / &
相关论文
共 6 条
[1]   A SENSITIVE SINGLE BEAM DEVICE FOR CONTINUOUS REFLECTANCE OR TRANSMITTANCE MEASUREMENTS [J].
BEAGLEHO.D .
APPLIED OPTICS, 1968, 7 (11) :2218-&
[2]   A NORMAL INCIDENCE SCANNING REFLECTOMETER OF HIGH PRECISION [J].
GERHARDT, U ;
RUBLOFF, GW .
APPLIED OPTICS, 1969, 8 (02) :305-&
[3]   A DOUBLE BEAM SPECTROPHOTOMETER FOR DIRECT MEASUREMENT OF INTEGRATED ABSORPTION LINES [J].
NICOL, DR .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1969, 40 (10) :1300-&
[4]  
RICE SO, UNPUBLISHED NOTES
[5]  
RICE SO, PERSONAL COMMUNICATI
[6]   WAVELENGTH MODULATION SPECTROMETER FOR STUDYING OPTICAL PROPERTIES OF SOLIDS [J].
SHAKLEE, KL ;
ROWE, JE .
APPLIED OPTICS, 1970, 9 (03) :627-&
1