X-RAY OBSERVATIONS OF LATTICE DEFECTS IN PARTICULAR, STACKING FAULTS IN NEIGHBOURHOOD OF A TWIN BOUNDARY IN SILICON SINGLE CRYSTALS

被引：33

作者：

KOHRA, K

YOSHIMATSU, M

机构：

来源：

JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN | 1962年 / 17卷 / 06期

关键词：

D O I：

10.1143/JPSJ.17.1041

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

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页码：1041 / &

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[21] EXPERIMENTAL EVIDENCE FOR FRANKS THEOREM ON DISLOCATIONS BY X-RAY DIFFRACTION MICROGRAPHY [J].

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JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1961, 16 (07) :1465-&

[22] X-RAY OBSERVATIONS ON CLEAVAGE FACES OF LIF SINGLE CRYSTALS [J].

YOSHIMATSU, M ;

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JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1960, 15 (10) :1760-1770

[23] X-RAY STUDY OF LATTICE DEFECTS IN SI-SINGLE CRYSTALS BY TRANSMISSION BERG-BARRETT TECHNIQUE [J].

YOSHIMATSU, M ;

KOHRA, K .

JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1960, 15 (12) :2367-2368