A NEW DEVICE FOR ELECTRICAL-RESISTIVITY MEASUREMENTS AS A FUNCTION OF TEMPERATURE (86-K 700-K) UNDER CONTROLLED-ATMOSPHERE BY THE 4-PROBE METHOD

被引：15
作者：
KOKABI, HR [1 ]
PROVOST, J [1 ]
DESGARDIN, G [1 ]
机构：
[1] TELEMECAN GRP SCHNEIDER,DIRECT RECH & DEV,F-92002 NANTERRE,FRANCE
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 1993年 / 64卷 / 06期
关键词：
D O I：
10.1063/1.1144025
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
A device for measuring electrical resistivity as a function of temperature using unsoldered, sharp, and independent contacts has been developed. The probes are fixed on fine ceramic tubes, which are actuated by pressure-sensitive springs. The ceramic tubes are guided by metallic struts that also serve as thermal screens. The device is placed in an enclosure where a primary vacuum is established and introduce a neutral, reducing, or oxidizing gas. Measurement can be performed continually between 86 and 700 K. Materials having resistivities in the 10(-8)-10(6) OMEGA m range have been characterized even when they present resistivity jumps of many orders of magnitude.
引用
收藏
页码：1549 / 1553
页数：5
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