VACUUM BREAKDOWN WITH MICROSECOND DELAY-TIME

被引：10
|
作者：
ANDERS, S
JUTTNER, B
LINDMAYER, M
RUSTEBERG, C
PURSCH, H
UNGERWEBER, F
机构：
[1] TECH UNIV CAROLO WILHELMINA BRAUNSCHWEIG,INST ELEKTR ENERGIEANLAGEN,W-3300 BRAUNSCHWEIG,GERMANY
[2] TECH UNIV CAROLO WILHELMINA BRAUNSCHWEIG,INST SCHWEISSTECH,W-3300 BRAUNSCHWEIG,GERMANY
[3] AEG WESTINGHOUSE TRANSPORT SYST GMBH,BERLIN,GERMANY
来源：
IEEE TRANSACTIONS ON ELECTRICAL INSULATION | 1993年 / 28卷 / 04期
关键词：
D O I：
10.1109/14.231526
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The delay time of voltage breakdown has been analyzed as a function of the time interval to preceding interruption of high currents. With intervals > 1 ms the behavior of the gap corresponded to cold electrodes. For this case, in a separate experiment, the dependence of the delay time on various parameters has been studied. At constant voltage a steep increase with the gap distance was found. This leads to the conclusion that field emission rather than a clump process is responsible for late breakdowns.
引用
收藏
页码：461 / 467
页数：7
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