THE EFFECT OF RISE-TIME AND FIELD GRADIENT ON NONLINEAR BIT SHIFT IN THIN-FILM HEADS

被引：11
作者：
TORABI, AF
MALLARY, ML
MARSHALL, S
机构：
[1] Digital Equipment Corporation, Shrewsbury
来源：
IEEE TRANSACTIONS ON MAGNETICS | 1994年 / 30卷 / 06期
关键词：
D O I：
10.1109/20.333931
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
We present a discussion of nonlinear bit shift in thin film inductive heads. A three dimensional finite element model and two dimensional dynamic and self consistent model were used to calculate the nonlinear bit shift as a function of rise time, write current waveform and pole tip saturation. The analysis shows a strong dependency of nonlinear bit shift on rise time and write pole magnetic image. A comparison of experimental data with the theoretical model is presented.
引用
收藏
页码：3879 / 3881
页数：3
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